The analytical expression of the density of trapping charges is proposed. The method and the results of parameters extraction are also presented.
2
通过对载流子扩散机理的研究,由数学公式的推导,得到陷阱电荷分布随电场变化的函数关系。
Substituting the electric field distributions into the formula we ve induced, we got the trapped charge distribution inside the buried oxide during total irradiation under different bias states.
3
然后对不同应力电压、不同沟道长度下氧化层陷阱电荷(包括空穴和电子陷阱俘获)的产生做了进一步的分析。
Thus, the relationships of oxide charge generation, including electron trapping and hole trapping effects, with different stress voltages and channel lengths are analyzed.