A combinational logic element having at least one input channel.
一种至少有一个输入通道的组合逻辑元件。
The test approach can detect any combinational faults within basic cell of CUT.
该测试方法能侦测到被测电路基本组成单元的任意组合失效；
The result of test told us that combinational acting condition is the worst condition.
试验结果表明，联合工况是最危险的工况。
The result of test told us that combinational acting condition is the worst condition.
试验结果表明，联合工况是最危险的工况。
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