• The effects of solvent, surfactant on the process of electrospinning and the morphology of the electrospun nanofibers were studied with scanning electron microscopy(SEM).

    利用扫描电子显微镜探讨了不同溶剂体系表面活性剂纺丝过程纳米纤维形态影响

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  • Methods: studying growth and aggregation of COM crystals using the scanning electron microscopy (SEM).

    方法利用扫描电子显微镜SEM观察COM生长聚集

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  • The worn surfaces of the steel balls were analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).

    扫描电子显微镜(sem)X射线光电子能谱仪(XPS)对钢球磨损表面进行了分析。

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  • Morphological microstructure, such as surface, interface and surface of coated fertilizer after nutrient being released in water, was studied by scanning electron microscopy (SEM).

    扫描电子显微镜(SEM)对包膜肥料表面界面养分溶解释放的表面进行微观形态结构研究。

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  • The constituents and the structures of the diamond films have been identified by means of scanning electron microscopy (SEM), Raman spectroscopy and X-ray diffraction.

    利用扫描电子显微镜SEM )、显微喇光谱X射线衍射手段合成金刚石薄膜成分结构进行了分析。

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  • Worn surface morphology and element chemistry configuration of steel ball were analyzed by means of X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM).

    扫描电子显微镜X射线光电子能谱仪观察分析了磨损表面形貌元素化学形态

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  • The adherence of 19 SE strains isolated from patients was assayed by three different methods, namely, quantitative adherence assay, scanning electron microscopy (SEM) and light microscopy.

    用半定量粘附实验、扫描电子显微镜光学显微镜检测临床分离19表葡的粘附能力。

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  • The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).

    采用扫描电子显微镜(sem)、X射线光电子能谱仪(XPS)、傅立叶红外光谱仪(IR)对盘上磨进行表面分析。

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  • The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).

    薄膜表面形态特征采用扫描电子显微技术(SEM),X射线衍射(XRD)以及原子显微技术(afm)描述。

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  • Influence of CO2 partial pressure on corrosion scale of P110 steel in stimulated oil field environments was investigated by using scanning electron microscopy(SEM) and x-ray diffraction(XRD).

    利用高温高压釜设备辅以失重法、采用扫描电子显微镜SEMX射线衍射XRD)技术,研究了动静两种状态下CO2P110腐蚀产物膜影响

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  • The scanning electron microscopy (SEM) indicated that the adhesion at the interface could be enhanced by PP-HBP and the phase separation of PP/PVC blends could be reduced.

    扫描电子显微镜SEM)研究结果证明,PP-HBP增强了PP/PVC界面粘结作用,减小了共混体系分离程度

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  • The fracture morphology of PC, PA6, LDPE is analyzed by using scanning electron microscopy (SEM), and the fracture cause, fracture process and fracture morphology are discussed respectively.

    利用扫描电子显微镜观察分析了聚碳酸酯尼龙6低密度聚乙烯的微观断裂行为,对其断裂起因、断裂过程断裂形态进行了讨论。

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  • The morphologies and structures obtained the anodized aluminum films were characterized by scanning electron microscopy (SEM). Transmission electron microscopy (TEM) and atom force microscopy (AFM).

    并用扫描电子显微镜(sem)、透射电子显微镜(TEM)原子显微镜(afm)阳极氧化铝的形貌和结构进行了表征

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  • The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.

    原子显微镜AFM),扫描电子显微镜(SEM),X 射线粉末衍射仪XRD),BET 比表面积分析仪对结构进行表征

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  • The compositions of the coatings were analyzed by energy dispersive X-ray microanalysis system (EDS). The morphology of the coatings was observed by scanning electron microscopy (SEM).

    采用能量色散x射线谱(EDS)分析得出涂层成分利用扫描电子显微镜(SEM)观察涂层形貌

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  • Surface morphologies were observed by scanning electron microscopy (SEM), and X-ray diffraction (XRD) was used to analyze the crystal corrosion products.

    采用扫描电子显微镜(SEM)观察表面腐蚀形貌XRD进行腐蚀产物分析

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  • The compositions of the coatings were analyzed by energy dispersive X-ray microanalysis system (EDS), and the morphology of the coatings was observed by scanning electron microscopy (SEM).

    采用能量色散x射线谱(EDS)分析得出镀层成分利用扫描电子显微镜(SEM)观察镀层形貌

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  • Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.

    用俄歇电子能谱(AES)、扫描电镜(sem)原子显微镜(afm)对薄膜组成成分表面形貌进行了分析

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  • Scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS) were used to evaluate the structure and composition.

    利用扫描电子显微镜(sem)、透射电子显微镜(tem)X射线光电子(XPS)样品的形貌、结构组份进行表征。

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  • Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.

    通过使用原子吸收光谱仪扫描显微镜能量色散X射线仪对覆膜光纤探针进行表征

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  • The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).

    分别电子探针EPMA)、X衍射XRD扫描电镜SEM)查证了其组分、相结构和显微结构梯度分布

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  • Scanning electron microscopy (SEM) was used to further explore the surface ultrastructure of selected ECM scaffolds.

    应用扫描电镜进一步探测每种ECM支架表面超微结构

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  • X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.

    用X射线衍射XRD)、扫描电镜SEM)、分辨率透射电镜(HRTEM和光致发光光谱PL生成的产物进行分析

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  • A high speed image scanning system was designed to meet the requirement of fast scanning large images, which was based on scanning electron microscopy (SEM).

    满足快速扫描大面积图形需要设计基于扫描电镜高速图形检测系统

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  • X-ray powder diffraction(XRD), scanning electron microscopy(SEM), transmission electron microscopy(TEM) and photoluminescence spectra were used to characterize the resulted BAM phosphor.

    通过X射线粉末衍射XRD)、扫描电镜SEM)、透射电镜(TEM以及荧光光谱获得的试样进行了表征

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  • Then their structures and composing are analyzed by Fourier transform infrared spectroscopy(FT-IR), X-ray diffraction(X-RD), scanning electron microscopy(SEM).

    红外光谱X-射线衍射扫描电镜分析结构组成,对膜进行降解性、溶涨性和兔眼生物相容性实验研究。

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  • Then we detected the physiochemical characteristics of the MS sample through scanning electron microscopy ( SEM ) , infrared spectrum ( IR )and differential thermal analysis ( DTA ) .

    通过多种检测手段,如:扫描电镜SEM)、红外光谱IR)、示差分析DTA)等对制备样本理化特性进行检测。

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  • The as-obtained products were characterized with scanning electron microscopy (SEM) and X-ray diffraction (XRD).

    并分别扫描电镜粉末X射线表征形貌和相结构。

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  • Fracture surfaces and secondary cracks morphologies were observed using scanning electron microscopy (SEM).

    扫描电镜断口二次裂纹形貌进行观察

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  • The structure, surface morphology and the optical properties were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and photoluminescence (PL).

    X 射线衍射XRD)、扫描电镜SEM)、荧光光谱PL)对样品进行结构形貌发光特性的分析。

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