In this paper are described an ISS thin film analyzer compatible with AES technique and all the necessary measures to switch from one technique to the other.
本文介绍一种与AES技术兼容的ISS薄膜分析器，并指出两者兼容时对仪器所必须采取的各种重要措施。
When these switch components are composed of a thin film transistor, the testing device at least includes a switch wiring coupled to the gates of the thin film transistor.
当开关组件是由薄膜晶体管所构成时，测试装置更包括至少一开关配线，电性耦接至薄膜晶体管的闸极。
A novel low temperature switch material VO2 thin film was fabricated by ion-sputtering and annealing.
采用离子束溅射和退火工艺制备了一种新的相变型薄膜vo2。
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