forward biased second breakdown
forward biased junction ==> 正向偏压结 forward biased second breakdown ==> 正向偏压二次击穿 forward blocking interval ==> 正向闭锁期间,正向关断期间 ..
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forward biased second breakdown
正偏二次击穿
以上为机器翻译结果，长、整句建议使用 人工翻译 。
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The development of the test instrument for forward-biased second breakdown for characteristics of power transistors (GIR) is described and main parameters are given.
本文对功率晶体管(GTR)正偏二次击穿测试仪的研制进行了说明，并给出了主要技术参数。
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