The generation mechanism of stress induced leakage current (SILC) in flash memory cell is studied by experiments.
通过实验研究了闪速存储器存储单元中应力诱生漏电流(ILC)产生机理。
By discussing the generation mechanism of stray current, the necessary measures for preventing and controlling stray current are suggested in this paper.
通过对杂散电流形成机理的分析讨论，提出了防治杂散电流的必要措施。
By the transmission line theory, the generation mechanism of common-mode voltage and the bearing current was discussed.
对变频输出共模电压及轴承电流的形成机理进行了研究，分析了其对潜油电泵轴承寿命的危害。
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