This study is a step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light-emitting devices.
文中介绍了一种基于概率方法的半导体发光器件可靠性预计模型。
This study is a step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light-emitting devices.
文中介绍了一种基于概率方法的半导体发光器件可靠性预计模型。
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